Loading...
Bienvenue sur la collection HAL de l'équipe CMNE du laboratoire CROMA
Les recherches menées au sein de l'équipe Composants Micro Nano Electroniques (CMNE) s'intéressent aux composants de base de l'électronique du futur.
Dernières publications
-
Owen Gauthier, Sébastien Haendler, Quentin Rafhay, Christoforos Theodorou. Applicability of the Carrier Number Fluctuations Model for Random Telegraph Noise of Nanoscale MOSFETs Operating in Saturation. 2023 International Conference on Noise and Fluctuations (ICNF), Oct 2023, Grenoble, France. pp.1-4, ⟨10.1109/ICNF57520.2023.10472748⟩. ⟨hal-04742951⟩
-
Alexandra Diaz, Chloé Wulles, Christoforos Theodorou, Anne Kaminski, Quentin Rafhay. Experimental Evidence of Light Source Contribution in the Noise of Optoelectronic Devices Under Illumination. 2023 International Conference on Noise and Fluctuations (ICNF), Oct 2023, Grenoble, France. pp.1-4, ⟨10.1109/ICNF57520.2023.10472759⟩. ⟨hal-04742976⟩
-
Quang Chieu Bui, Vincent Consonni, Sarah Boubenia, Guillaume Gay, Corinne Perret, et al.. Influence of the AZO Electrode on ZnO Nanowire Growth by PLI-MOCVD and Related Piezoelectric Performance: Implications for Mechanical Energy Transducers. ACS Applied Nano Materials, 2023, 6 (9), pp.7436-7445. ⟨10.1021/acsanm.3c00608⟩. ⟨hal-04215277⟩
-
Thomas Jalabert, Manojit Pusty, Andrés Jenaro Lopez Garcia, Alessandro Cresti, Mireille Mouis, et al.. ZnO nanowires based piezoelectric transducers: the role of size and semiconducting properties. SPIE Optics + Optoelectronics, Apr 2023, Prague, Czech Republic. pp.1258406-1, ⟨10.1117/12.2665500⟩. ⟨hal-04160671⟩
-
Owen Gauthier, Sébastien Haendler, Ronan Beucher, Patrick Scheer, Quentin Rafhay, et al.. Static and LFN/RTN Local and Global Variability Analysis Using an Addressable Array Test Structure. 2023 35th International Conference on Microelectronic Test Structure (ICMTS), Mar 2023, Tokyo, Japan. pp.1-6, ⟨10.1109/ICMTS55420.2023.10094087⟩. ⟨hal-04305404⟩
-
Donghyun Kim, Sylvain Barraud, Gérard Ghibaudo, Christoforos Theodorou, Jae Woo Lee. Drain Current Variability in 2-levels Stacked Nanowire Gate All Around P-type Field Effect Transistors. 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Mar 2023, Seoul, South Korea. pp.1-3, ⟨10.1109/EDTM55494.2023.10103067⟩. ⟨hal-04305370⟩
Documents en texte intégral
163
Notices
1 545
Collaborations